The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

May. 02, 2022
Applicant:

Senseonics, Incorporated, Germantown, MD (US);

Inventors:

Andrew Dehennis, Germantown, MD (US);

Patricia Sanchez, Germantown, MD (US);

Samanwoy Ghosh-Dastidar, Germantown, MD (US);

Assignee:

Senseonics, Incorporated, Germantown, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/1495 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1495 (2013.01); A61B 5/0017 (2013.01); A61B 5/7246 (2013.01); A61B 2560/0228 (2013.01); A61B 2560/0238 (2013.01);
Abstract

Methods, systems, and apparatuses for dynamic modification of calibration frequency. Dynamic modification of calibration frequency may include one or more of: receiving sensor data conveyed by an analyte sensor comprising an analyte indicator, using the sensor data to calculate one or more analyte levels, and receiving one or more reference analyte level measurements. Dynamic modification of calibration frequency may include using the sensor data, the one or more calculated analyte levels, and/or the one or more reference analyte level measurements to calculate a degradation rate of the analyte indicator of the analyte sensor. Dynamic modification of calibration frequency may include setting a dynamic calibration frequency based on the calculated degradation rate.


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