The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12458245 B1

Date of Patent:

Nov. 04, 2025

Filed:

Apr. 04, 2023

Magnetic resonance imaging system and correction method thereof

Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Yanchun Zheng, Beijing, CN;

Kun Wang, Beijing, CN;

Assignee:

GE Precision Healthcare LLC, Wauwatosa, WI (US);

Attorney:

Primary Examiner:

Neel D Shah

Int. Cl.

CPC ...

A61B 5/055 (2006.01); G01R 33/20 (2006.01); G01R 33/34 (2006.01); G01R 33/385 (2006.01); G01R 33/44 (2006.01); G01R 33/46 (2006.01); G01R 33/48 (2006.01); G01R 33/50 (2006.01); G01V 3/00 (2006.01); G16H 40/63 (2018.01); G16H 30/20 (2018.01);

U.S. Cl.

CPC ...

A61B 5/055 (2013.01); G16H 40/63 (2018.01); G16H 30/20 (2018.01);

Abstract

A magnetic resonance imaging system includes a processor. The processor is configured to acquire a variation of a first system state parameter during a scanning process of the magnetic resonance imaging system, determine, according to the variation of the first system state parameter, a variation of a second system state parameter on the basis of a function relationship between the first system state parameter and the second system state parameter, and correct the magnetic resonance imaging system on the basis of the variation of at least one of the first system state parameter and the second system state parameter.

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