The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Mar. 26, 2023
Topcon Corporation, Tokyo, JP;
Takafumi Yukimori, Tokyo, JP;
Makoto Saika, Tokyo, JP;
Yoko Tatara, Tokyo, JP;
Akio Hayashi, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
An ophthalmologic apparatus includes a subjective measurement optical system configured to measure a subjective refractive value of a subject eye; an objective measurement optical system configured to measure objective refractive characteristics of the subject eye; and a controller configured to control the subjective measurement optical system and the objective measurement optical system. The controller is further configured to perform measurement of the objective refractive characteristics of the subject eye by the objective measurement optical system and perform objective monitoring to monitor objective measurement information obtained by the measurement of the objective refractive characteristics during a weakest power test in which a weakest point is being obtained by the subjective measurement optical system, a maximum visual acuity value or a set predetermined visual acuity value being readable from the weakest point.