The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Jan. 17, 2019
Koninklijke Philips N.v., Eindhoven, NL;
Zoi Tokoutsi, Eindhoven, NL;
Martin Grepl, Eindhoven, NL;
Marco Baragona, Delft, NL;
Alfonso Agatino Isola, Eindhoven, NL;
Jacek Lukasz Kustra, Eindhoven, NL;
Ralph Theodorus Hubertus Maessen, Roermond, NL;
Karen Veroy-Grepl, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The invention relates to a planning apparatus () for determining an ablation probe parameter. A thermal energy determination unit determines, in a first part of a planning procedure, a first thermal energy distribution by using a thermal energy function like a Bioheat equation such that a temperature-based condition is fulfilled, which is indicative of a desired treatment outcome for a subject (). An ablation probe parameter determination unit determines, in a second part, the ablation probe parameter by using a second thermal energy function, which relates a second thermal energy distribution to be caused by the ablation probe () to b) the ablation probe parameter, such that a deviation between the first thermal energy distribution and the second thermal energy distribution fulfils a predefined deviation criterion. This dissection into two parts allows for an improved adaptability of the determination of the ablation probe parameter to different types of ablation procedures.