The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Nov. 28, 2022
Zhejiang University, Hangzhou, CN;
Fei Liu, Hangzhou, CN;
Rui Yang, Hangzhou, CN;
Jun Zhou, Hangzhou, CN;
Xiangyu Lu, Hangzhou, CN;
Riqun Ni, Hangzhou, CN;
Mengyuan Chen, Hangzhou, CN;
Jie Jiao, Hangzhou, CN;
Zhejiang University, Hangzhou, CN;
Abstract
The present disclosure provides a crop yield estimation method and system based on level identification and weighted decision fusion. The method includes: inputting an obtained visible light image of a target crop field at maturity into a yield level classification model, to obtain yield level output values corresponding to all yield levels of the visible light image of the target crop field at maturity, where the yield levels are determined according to a yield level rule; calculating a confidence score corresponding to each of the yield level output values, and sorting the confidence scores in descending order; selecting the first m confidence scores, and performing normalization on the first m confidence scores to obtain m yield level weights; and respectively multiplying the m yield level weights and corresponding yield levels, and adding up all products, to obtain an estimated yield of the target crop field at maturity.