The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2025

Filed:

Feb. 09, 2023
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Marwa Sai, Munich, DE;

Andrew Schaefer, Oberhaching, DE;

Benoit Derat, Munich, DE;

Adam Tankielun, Ottobrunn, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/17 (2015.01); H01Q 21/24 (2006.01);
U.S. Cl.
CPC ...
H04B 17/17 (2015.01); H01Q 21/24 (2013.01);
Abstract

A computer-implemented method for detecting and localizing faults in an antenna array comprises performing fault detection on the antenna array to identify the presence of at least one faulty antenna element of the antenna array. The fault detection is performed using a machine learning technique. It is determined whether the antenna array is faulty or non-faulty, based on a result of the performed fault detection. The at least one faulty antenna element is localized if the antenna array is determined to be faulty, using a machine learning technique.


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