The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
May. 02, 2023
Fujitsu Limited, Kawasaki, JP;
Jingnan Li, Beijing, CN;
Zhenning Tao, Beijing, CN;
Fujitsu Limited, Kawasaki, JP;
Abstract
An apparatus and method to measure nonlinear system noises may include a processor to generate a bilateral notch signal, a unilateral notch signal and a multi-tone signal; to measure power of an additive Gaussian white noise of a nonlinear system by using the multi-tone signal; to measure a first power-to-noise ratio of the nonlinear system by using the bilateral notch signal; to measure a second power-to-noise ratio of the nonlinear system by using the unilateral notch signal. The processor is to calculate a nonlinear power-to-noise ratio of the nonlinear system and a power-to-noise ratio introduced by IQ imbalance according to the power of the additive Gaussian white noise, the first power-to-noise ratio and the second power-to-noise ratio.