The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2025

Filed:

Jan. 21, 2022
Applicants:

Huazhong University of Science and Technology, Hubei, CN;

Wuhan Zhongke Industrial Research Institute of Medical Science Co., Ltd, Hubei, CN;

Tongji Hospital, Tongji Medical College, Huazhong University of Science and Technology, Hubei, CN;

Inventors:

Qiang Li, Hubei, CN;

Fan Lin, Hubei, CN;

Peng Zhang, Hubei, CN;

Yuting Chen, Hubei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/30 (2018.01); A61B 5/00 (2006.01); A61B 5/352 (2021.01); G16H 40/67 (2018.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G16H 50/30 (2018.01); A61B 5/352 (2021.01); A61B 5/7203 (2013.01); G16H 50/20 (2018.01); G16H 40/67 (2018.01);
Abstract

The invention provides an atrial fibrillation risk prediction system based on heartbeat rhythm signals. A heartbeat rhythm signal preprocessing module obtains heartbeat interval sequence data by calculating the time interval of two adjacent heartbeats. During sample labeling, a positive sample is from heartbeat interval data during the sinus heart rate period of a case with high AF risk, and a negative sample is from heartbeat interval data of a case with low AF risk; and an atrial fibrillation risk prediction model is trained with positive and negative samples and is used to test heartbeat interval data, an AF risk curve between the proportion of positive samples and output probability thresholds is obtained according to the output probabilities of testing samples, the area under the AF risk curve is calculated as the atrial fibrillation risk value, and the value can reflect the atrial fibrillation risk.


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