The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Nov. 24, 2021
Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;
Kai Cui, Shanghai, CN;
Yong E, Shanghai, CN;
Jing Yan, Shanghai, CN;
Na Zhang, Shanghai, CN;
Le Yang, Shanghai, CN;
Hanyu Wang, Shanghai, CN;
Juan Feng, Shanghai, CN;
Haihua Zhou, Shanghai, CN;
Xuefei Lu, Shanghai, CN;
Guanji Leng, Shanghai, CN;
Yang Hu, Shanghai, CN;
SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD., Shanghai, CN;
Abstract
A method include obtaining original projection data of an object. The original projection data may be acquired by scanning the object using a radiation device from one or more projection views. The original projection data may include truncation projection data that is acquired from at least one of the one or more projection views. In each of the at least one of the one or more projection views a truncation region of the object may be located outside an FOV of the radiation device. The method may include obtaining a target S-shaped extrapolation function based on the original projection data. The method may include determining, based on the target S-shaped extrapolation function and the original projection data, extended projection data corresponding to the at least one truncation region. The method may include generating an image of the object based on the original projection data and the extended projection data.