The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2025

Filed:

Aug. 22, 2022
Applicant:

Tencent Technology (Shenzhen) Company Limited, Guangdong, CN;

Inventors:

Shenghao Zhang, Shenzhen, CN;

Yonggen Ling, Shenzhen, CN;

Wanchao Chi, Shenzhen, CN;

Yu Zheng, Shenzhen, CN;

Xinyang Jiang, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/55 (2017.01); G06V 10/44 (2022.01); G06V 20/10 (2022.01);
U.S. Cl.
CPC ...
G06T 7/55 (2017.01); G06V 10/44 (2022.01); G06V 20/10 (2022.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01);
Abstract

A scene contour recognition method is provided. In the method, a plurality of scene images of an environment is obtained. Three-dimensional information of a target plane in the plurality of scene images is determined based on depth information for each of the plurality of scene images, The target plane corresponds to a target object in the plurality of scene images. A three-dimensional contour corresponding to the target object is generated by fusing the target plane in each of the plurality of scene images based on the three-dimensional information of the target plane in each of the plurality of scene images. A contour diagram of the target object is generated by projecting the three-dimensional contour onto a two-dimensional plane.


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