The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2025

Filed:

Jun. 22, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Young Hoon Kim, Suwon-si, KR;

Kun Dong Kim, Suwon-si, KR;

Sung Su Kim, Suwon-si, KR;

Jin Hyun Kim, Suwon-si, KR;

Da Gyeom Hong, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); H04N 23/80 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); H04N 23/80 (2023.01); G06T 2207/20081 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A system of automatic optimization of image quality of an image sensor includes an image learning data generation unit generating an image tuning knowledge database, which includes pairs of a plurality of sets of values of a plurality of parameters and a plurality of sets of image quality evaluation scores for a plurality of image quality evaluation items for evaluating a quality of each of a plurality of images generated by the image sensor, using an image tuning database sampling module, an image signal processor modeling unit generating a machine learning model, for each image, for automatically optimizing the quality of each image, and an image sensor image quality optimization unit automatically controlling values of some of the plurality of parameters based on a user's image quality selection and the machine learning model. The image quality evaluation scores are produced by a distributed camera simulation system including servers.


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