The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2025

Filed:

Sep. 22, 2023
Applicant:

The Boeing Company, Arlington, VA (US);

Inventors:

Veniamin Stryzheus, Kent, WA (US);

Matthew J. Chen, Seattle, WA (US);

Assignee:

The Boeing Company, Arlington, VA (US);

Primary Examiner:
Int. Cl.
CPC ...
G06T 5/50 (2006.01); G06T 7/00 (2017.01); H04N 5/265 (2006.01); H04N 23/54 (2023.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
G06T 5/50 (2013.01); G06T 7/0004 (2013.01); H04N 5/265 (2013.01); H04N 23/54 (2023.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01); G06T 2200/24 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30108 (2013.01);
Abstract

An inspection system for capturing a topography of a surface includes a support frame configured to be positioned over the surface, at least three light sources configured to be mounted at different locations on the support frame, and at least two cameras each having a viewing direction and configured to be mounted at different locations on the support frame in a manner such that the viewing direction of each camera points generally toward a common region of the surface. The inspection system also includes a processor configured to: temporarily activate the light sources one at a time and cause all the cameras to capture a respective plurality of images of the common region each time a light source is activated, and combine the images in a manner that results in a reconstructed surface representing the topography of the common region.


Find Patent Forward Citations

Stryzheus, Veniamin. (2025). Inspection system and method (U.S. Patent No. 12456170). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12456170

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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