The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Oct. 14, 2020
Lg Electronics Inc., Seoul, KR;
Yi Hu, Seoul, KR;
Sangyun Kim, Seoul, KR;
Run Cui, Seoul, KR;
Hyunwoo Kim, Seoul, KR;
Jaehong Eom, Seoul, KR;
LG ELECTRONICS INC., Seoul, KR;
Abstract
A product inspection apparatus including a camera configured to capture an image of a product to be inspected; and a processor configured to extract defect information from a defect indicated by the captured image of the product, generate first virtual defect data including at least one of a location, a size and a shape of the defect included in the captured image, based on the extracted defect information, generate second virtual defect data by synthesizing the first virtual defect data with non-defect data representing the product without the defect, and generate final virtual defect data by inputting the second virtual defect data to an artificial intelligence generative model.