The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Feb. 06, 2020
Renesas Electronics Corporation, Tokyo, JP;
Kei Hagiwara, Tokyo, JP;
RENESAS ELECTRONICS CORPORATION, Tokyo, JP;
Abstract
The abnormality detection device includes a first extraction unit extracting an input waveform data from a waveform data input to the first extraction unit, a first determination unit for determining whether the input waveform data includes a detection object waveform data, a second extraction unit for extracting and outputting the detection object waveform data from the input waveform data when the input waveform data is determined to include the detection object waveform data by the first determination unit; and a second determination unit for determining whether the detection target device has an abnormality based on whether the detection object waveform output from the second extraction unit indicates an abnormality.