The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Apr. 25, 2024
Ebay Inc., San Jose, CA (US);
EBAY INC., San Jose, CA (US);
Abstract
Systems and methods are directed to detecting data anomalies. A data analysis system accesses data generated on a data platform. The data analysis system then analyzes the data to detect one or more data anomalies. The analyzing includes generating an optimal coordinate system without reducing a number of dimensions using principal component analysis (PCA), transforming the data into the optimal coordinate system without reducing the number of dimensions, and applying a sigma rule to the transformed data on the optimal coordinate system. The sigma rule can be the 3-sigma rule. In some cases, the data analysis system generates and transmits a notification or alert to a user or downstream component regarding the one or more data anomalies. In some cases, the data analysis system removes the one or more data anomalies to derive updated data and can provide the updated data to downstream systems for use.