The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2025

Filed:

Aug. 22, 2023
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Mokrane Amzal, Courbevoie, FR;

Guillaume Lasnier, Walldorf, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01); G06F 16/242 (2019.01); G06F 18/214 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2264 (2019.01); G06F 16/221 (2019.01); G06F 16/2272 (2019.01); G06F 16/244 (2019.01); G06F 18/2148 (2023.01); G06N 20/00 (2019.01);
Abstract

Provided is a system and method for automated feature engineering of multidimensional data. The system and method may generate a flat data set for use in training a machine learning model from a multidimensional data set. In one example, the method may include extracting metadata of multidimensional data, generating declarative statements of features that are to be derived from the multidimensional data based on hierarchical attributes of the multidimensional data which are identified from the extracted metadata, querying, via a query engine, the multidimensional data based on the generated declarative statements to generate the derived features, and storing the derived features in a training data set.


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