The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2025

Filed:

Jan. 06, 2023
Applicant:

Ethernovia Inc., San Jose, CA (US);

Inventors:

Anil Tukaram Dhonde, Amsterdam, NL;

Darren S. Engelkemier, Menlo Park, CA (US);

Roy T. Myers, Jr., Morgan City, CA (US);

Hossein Sedarat, San Jose, CA (US);

Assignee:

Ethernovia Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3698 (2025.01); G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3698 (2025.01); G06F 11/3684 (2013.01); G06F 11/3688 (2013.01);
Abstract

Various embodiments provide for a unified interface for testing a system, which can include a device under test (DUT). In particular, some embodiments described herein can be used to implement a Unified Test Framework (UTF) that comprises an architecture that provides a unified (or common) software interface to one or more test methods used during a development life cycle of a system. Example test methods can include, without limitation, modeling, verification, simulation, emulation, validation, customer support, and the like.


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