The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Oct. 20, 2022
Dell Products L.p., Round Rock, TX (US);
David C. Sydow, Merrimack, NH (US);
Anil Kumar Koluguri, Durham, NC (US);
Jeremy Denis White, Londonderry, NH (US);
Shobhit Nitinkumar Dutia, Westborough, MA (US);
Duhita Mulky Avinash, Melrose, MA (US);
Dell Products L.P., Round Rock, TX (US);
Abstract
Methods, apparatus, and processor-readable storage media for duplicate incident detection using a dynamic similarity threshold are provided herein. An example computer-implemented method includes obtaining a request including information associated with tracking at least a first incident in a database; generating a first representation of the first incident that encodes at least a portion of the information; computing a set of similarity scores for the first incident, where a given similarity score is based on a comparison between the first representation and a second representation generated for one of a plurality of additional incidents in the database; detecting that the first incident is a duplicate of at least one of the plurality of additional incidents based on a comparison of the set of similarity scores to a similarity threshold, where the similarity threshold is updated over time; and initiating an update in the database in response to the detecting.