The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Nov. 01, 2023
International Business Machines Corporation, Armonk, NY (US);
Daniel Nicolas Gisolfi, Hopewell Junction, NY (US);
Andrew C. M. Hicks, Highland, NY (US);
Tyler Vezio Rimaldi, Mahopac, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Method and apparatus for regression testing. A first plurality of sequences of events is generated by executing a plurality of test paths on a first computing environment. A test workload is constructed based on the first plurality of sequences of events. A second plurality of sequences of events is generated by executing the test workload on a second computing environment. One or more variances are identified by comparing the first plurality of sequences of events with the second plurality of sequences of events. And the second computing environment is reconfigured based on the one or more variances.