Tracking read voltages in memory devices using deep neural networks

Abstract

Devices, systems, and methods for improving performance of a memory device are described. An example method includes extracting parameters, which include a read threshold set, from each of a first set of host reads, replacing, based on the parameters, at least one host read from a second set of host reads by at least one host read from the first set of host reads, using a deep neural network (DNN) to generate an updated read threshold set, wherein an input to the DNN comprises the parameters from each of the second set of host reads subsequent to the replacing, and applying the updated read threshold set to the memory device to retrieve information from the memory device. In an example, the number of the first set of host reads is at least two orders of magnitude greater than the number of the second set of host reads.