The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Mar. 27, 2023
Nikon Corporation, Tokyo, JP;
Yamato Niitani, Yokohama, JP;
NIKON CORPORATION, Tokyo, JP;
Abstract
A microscope apparatus comprises: an illumination optical system that guides light from a light source to a sample; a detection unit that detects light from the sample; a detection optical system that has an objective lens and guides light from the sample to the detection unit; a mask that allows a portion of light from the sample and light from the light source to pass therethrough, and blocks the other portion; a mask-switching unit that changes mask patterns of the mask; a microscope control unit; and an information-processing device. The microscope control unit controls the mask-switching unit to change mask patterns. The information-processing device obtains information about the amount of movement of the focus position of the optical system including the objective lens when mask patterns are changed, and calculates the refractive index of the sample based on the obtained information about the amount of movement of the focus position.