The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Apr. 22, 2022
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Brandon E. Wilson, Portland, OR (US);
Carlo L. Tiana, Portland, OR (US);
Jeffery A. Finley, Cedar Rapids, IA (US);
Brian O. Helfrecht, Batavia, IL (US);
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Abstract
A system and method for performing a self-diagnostic test on an electronically scanned array is disclosed. The system includes an array of emitter antenna and receiver antenna elements, a controller configured to control the modulation of transmitting and received signals, and a monitoring processor configured to receive a signal quality input based on the transmitting and received signal, generate a control profile based on the signal quality input, compare at least one control profile to at least one of a predicted result signal or to control profiles from at least two other sets of control profiles, and determine a faulty set of individually addressable components that includes at least one faulty individually addressable component. The controller is configured to enhance one or more individually addressable components to compensate for the faulty addressable component.