Logic bist circuit and semiconductor device including same

Abstract

Provided are a logic built-in self-test (BIST) circuit that performs a scan test improving test coverage for each clock domain and a semiconductor device including the logic BIST circuit. The logic BIST circuit includes an OR gate configured to receive a scan enable signal and a register setting signal, and generate a modified scan enable signal; a clock gating circuit configured to output an enable clock irrespective of a function enable signal when the register setting signal has a first logic value, and a scan chain configured to capture an output of a first logic circuit connected to flip-flops according to the enable clock.