The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Jun. 09, 2021
Applicant:
Mitsubishi Electric Corporation, Tokyo, JP;
Inventor:
Tomohito Taniuchi, Nagasaki, JP;
Assignee:
Mitsubishi Electric Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2601 (2013.01); G01R 1/06705 (2013.01); G01R 1/06794 (2013.01);
Abstract
A plurality of electrodes () are provided on tip ends of a plurality of blocks () respectively. The plurality of lead terminals () are sandwiched by the plurality of blocks () and the plurality of wires () to correct positions of the plurality of lead terminals (). The plurality of electrodes () are brought into contact with the plurality of lead terminals () to inspect an electrical characteristic of the optical semiconductor device ().
Taniuchi, Tomohito. (2025). Inspection device for optical semiconductor device configured to correct positions of the plurality of lead terminals (U.S. Patent No. 12455312). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12455312
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile