The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Mar. 17, 2021
Applicant:
Hamamatsu Photonics K.k., Hamamatsu, JP;
Inventor:
Satoshi Yamamoto, Hamamatsu, JP;
Assignee:
HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01); G01N 21/6452 (2013.01); G02B 21/0032 (2013.01); G02B 21/0036 (2013.01); G01N 2021/6439 (2013.01); G01N 2201/103 (2013.01); G02B 21/06 (2013.01); G02B 2207/113 (2013.01);
Abstract
In this sample observation device, a reference table in which an optimum light amount of planar light at a measurement sensitivity represented by the product of a light amount of the planar light and a scanning speed is set according to the scanning speed is referred to, and the scanning speed of a scanning unit and the optimum light amount of the planar light that is applied to a sample are determined on the basis of the measurement sensitivity selected by a user.
Yamamoto, Satoshi. (2025). Sample observation device and sample observation method (U.S. Patent No. 12455241). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12455241
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