The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Apr. 05, 2023
Method, device and system for optical property measurement based on spatial frequency domain imaging
Beihang University, Beijing, CN;
Yanyu Zhao, Beijing, CN;
Yubo Fan, Beijing, CN;
Beihang University, Beijing, CN;
Abstract
A method for optical property measurement based on spatial frequency domain imaging, includes: obtaining a first target sinusoidal light pattern with a specified spatial frequency by modulating first light emitted by a light source in a spatial frequency domain, the number of coded bits of the first target sinusoidal light pattern is smaller than a preset number of bits; irradiating the first target sinusoidal light pattern to a surface of a sample to be detected; collecting light intensity distribution data of second light, the second light is formed after the first target sinusoidal light pattern is reflected by the sample to be detected; determining one or more optical property parameters of the sample to be detected according to the light intensity distribution data of the second light.