The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Oct. 08, 2020
Agco Corporation, Duluth, GA (US);
Kevin J. Hamilton, Newton, KS (US);
Patrick Kendrick, Hesston, KS (US);
AGCO Corporation, Duluth, GA (US);
Abstract
A system and method for evaluating individual subunits of material incorporated into a bale and, based thereon, assigning a weighted average quality value to the overall bale. A baler receives, aggregates, compresses, shapes, and secures subunits of a plant material into a bale. An NIR testing system receives and analyzes near-infrared radiation reflected by the plant material, and generates subunit evaluation data reflecting properties of the material in the subunits. A computer receives and combines the subunit evaluation data to produce overall evaluation data reflecting properties of the bale, and assigns the overall evaluation data to the bale. Combining the subunit evaluation data includes assigning weights to the subunit evaluation data and then averaging the weighted subunit property values. Weighting may be based on the amount of time the NIR testing system is exposed to the material in each subunit, and the amount of time may be mechanically determined.