The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Feb. 01, 2023
Applicant:
Raytheon Technologies Corporation, Farmington, CT (US);
Inventors:
Eli Warren, Wethersfield, CT (US);
Bryan J. Hackett, Berlin, CT (US);
Assignee:
RTX CORPORATION, Farmington, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 15/14 (2006.01); G01D 5/24 (2006.01); G01D 5/26 (2006.01);
U.S. Cl.
CPC ...
G01M 15/14 (2013.01); G01D 5/24 (2013.01); G01D 5/268 (2013.01);
Abstract
A measurement system is provided that includes a probe assembly. The probe assembly includes a capacitance probe and an optical probe. The capacitance probe includes a capacitance sensor that forms a sensor face of the probe assembly. An aperture projects axially through the capacitance sensor to the sensor face. The optical probe is configured with an optical line of sight through the aperture into a volume adjacent the sensor face.