The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Aug. 17, 2022
Applicant:
Flir Systems Ab, Täby, SE;
Inventors:
Tien C. Nguyen, Täby, SE;
Henning Hagman, Täby, SE;
Assignee:
FLIR Systems AB, Täby, SE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2022.01); G06T 5/50 (2006.01); G06V 10/25 (2022.01); G06V 10/98 (2022.01);
U.S. Cl.
CPC ...
G01J 5/00 (2013.01); G06T 5/50 (2013.01); G06V 10/25 (2022.01); G06V 10/98 (2022.01); G01J 2005/0077 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/20221 (2013.01);
Abstract
Techniques are provided for variable sensitivity in infrared imaging. In one example, an infrared imaging system includes an infrared imager and a logic device. The infrared imager is configured to capture a first infrared image of a scene using a sensitivity setting. The logic device is configured to determine a temperature associated with the scene based on a second infrared image of the scene. The logic device is further configured to determine the sensitivity setting based on an ambient temperature associated with the infrared imager and the temperature associated with the scene. Related devices and methods are also provided.