The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Nov. 16, 2021
Topcon Corporation, Tokyo-to, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
Provided is a surveying instrument including a distance measuring module configured to measure a distance to an object, an optical axis deflector configured to deflect the distance measuring light, a measuring direction image pickup module configured to acquire an observation image, an arithmetic control module, and an operation panel includes a display module, the arithmetic control module is configured to cause the optical axis deflector to perform a scan with a predetermined scan pattern and create an overlay image as a superimposition of the locus of the scan pattern on the observation image, and calculate a formula of a straight line or a curve line based on a measurement result of intersections or the closest points to the intersections between the straight line or the curve line drawn along a ridge line or a contour of the object and the locus of the scan pattern on the displayed overlay image.