The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2025

Filed:

Jun. 22, 2021
Applicant:

Electro Scientific Industries, Inc., Beaverton, OR (US);

Inventors:

Jan Kleinert, Beaverton, OR (US);

Zhibin Lin, Beaverton, OR (US);

Hisashi Matsumoto, Beaverton, OR (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/06 (2014.01); B23K 26/0622 (2014.01); B23K 26/082 (2014.01); B23K 26/382 (2014.01); B23K 26/70 (2014.01); B23K 103/00 (2006.01);
U.S. Cl.
CPC ...
B23K 26/382 (2015.10); B23K 26/0622 (2015.10); B23K 26/082 (2015.10); B23K 26/703 (2015.10); B23K 2103/54 (2018.08);
Abstract

Apparatus and techniques for laser-processing workpieces can be improved, and new functionalities can be provided. Some embodiments discussed relate to processing of workpieces in a manner resulting in enhanced accuracy, throughput, etc. Other embodiments relate to realtime Z-height measurement and, when suitable, compensation for certain Z-height deviations. Still other embodiments relate to modulation of scan patterns, beam characteristics, etc., to facilitate feature formation, avoid undesirable heat accumulation, or otherwise enhance processing throughput. A great number of other embodiments and arrangements are also detailed.


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