The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2025

Filed:

May. 08, 2023
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Björn Cederström, Stockholm, SE;

Changlyong Kim, Waukesha, WI (US);

Jiayin Ling, Waukesha, WI (US);

Ronald G. Kulas, Waukesha, WI (US);

Jingyi Liang, Waukesha, WI (US);

Mark Adamak, Waukesha, WI (US);

Assignee:

GE PRECISION HEALTHCARE LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/58 (2024.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/583 (2013.01); G01N 23/046 (2013.01); G01N 2223/3035 (2013.01); G01N 2223/419 (2013.01);
Abstract

Systems and methods are provided for calibrating computed tomography (CT) system. In one example, a method for a computed tomography (CT) system comprises, during a calibration of the CT system, measuring a position of a detector element of a detector array of the CT system using a wire of a wire phantom coupled to a table of the CT system, during a rotational scan performed using the CT system; and during a subsequent scan performed on a subject using the CT system, applying the measured position of the detector element rather than a design target position of the detector element during reconstruction of an image from projection data acquired via the CT system; and displaying the reconstructed image on a display device of the CT system.


Find Patent Forward Citations

Loading…