The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2025
Filed:
Mar. 18, 2020
I-sens, Inc., Seoul, KR;
David Lee, Seoul, KR;
Young Jea Kang, Seoul, KR;
Ji Seon Nah, Seoul, KR;
Jung Hee Seo, Seoul, KR;
Hak Hyun Nam, Seoul, KR;
I-SENS, INC., Seoul, KR;
Abstract
The present disclosure relates to a method for processing noise in biometric information measurement data, wherein the method for processing noise in biometric information measurement data, according to one embodiment of the present invention, may comprise the steps of: measuring biometric information by a sensor-transmitter which is placed on a part of a user's body and which measures biometric information of the user; transmitting data on the measured biometric information from the sensor-transmitter to a communication terminal; processing noise in the biometric information data transmitted to the communication terminal; and displaying the noise-processed biometric information data on the communication terminal. According to the present invention, it is possible to obtain accurate biometric information data by processing various types of noise included in biometric information data by using various algorithms to process steps for removing noise in a sequential manner.