The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Mar. 14, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Eunsub Shim, Suwon-si, KR;

Jungchak Ahn, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10F 39/00 (2025.01); H04N 25/772 (2023.01); H04N 25/778 (2023.01); H04N 25/79 (2023.01); H10F 39/18 (2025.01);
U.S. Cl.
CPC ...
H10F 39/8037 (2025.01); H04N 25/772 (2023.01); H04N 25/778 (2023.01); H04N 25/79 (2023.01); H10F 39/182 (2025.01);
Abstract

An image sensor including: a first layer including a plurality of photodiodes arranged in a plurality of pixel regions in a first substrate, an optical region disposed on an upper surface of the first substrate, and an element region, wherein, in at least one of the plurality of pixel regions, the element region includes a first impurity region, a first transfer gate disposed between the first impurity region and the photodiode, a second impurity region isolated from the first impurity region, and a second transfer gate disposed between the second impurity region and the photodiode: and a second layer including a second substrate stacked with the first layer, wherein the second layer includes a first transistor connected to the first impurity region by a first contact, and a second transistor connected to the second impurity region by a second contact.


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