The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Dec. 21, 2022
Applicant:
Ionq, Inc., College Park, MD (US);
Inventors:
Sarah Margaret Kreikemeier, Washington, DC (US);
Kai Makoto Hudek, Hyattsville, MD (US);
Assignee:
IonQ, Inc., College Park, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 7/20 (2006.01); F17C 3/08 (2006.01); G06F 1/20 (2006.01); G01D 5/241 (2006.01); G01D 5/26 (2006.01);
U.S. Cl.
CPC ...
H05K 7/20372 (2013.01); F17C 3/085 (2013.01); G06F 1/20 (2013.01); F17C 2221/017 (2013.01); G01D 5/2417 (2013.01); G01D 5/266 (2013.01);
Abstract
Aspects of the present disclosure relate generally to systems and methods for use in the implementation and/or operation of quantum information processing (QIP) systems, and more particularly, to the implementation and operation of a non-contact displacement measurement technique for cryogenic stabilization in QIP systems.
Kreikemeier, Sarah. (2025). Non-contact displacement measurement for cryogenic stabilization (U.S. Patent No. 12453051). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12453051
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile