The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Oct. 25, 2021
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventor:

André Goossen, Eldena, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/54 (2006.01);
U.S. Cl.
CPC ...
H05G 1/54 (2013.01);
Abstract

The present invention relates to a method and system for predicting X-ray degradation, the system comprising; a generator () configured to generate a deployment fingerprint data set for recording cumulative radiation exposure of a currently deployed X-ray tube; a database () configured to provide a training data set comprising multiple tube fingerprint data sets for recording cumulative radiation exposure of previously deployed X-ray tubes correlated with failures of the previously deployed X-ray tubes; and a neural network () configured to be trained using the training data set and configured to predict at least one parameter of the currently deployed X-ray tube based on the training.


Find Patent Forward Citations

Goossen, André. (2025). Predicting tube degradation via filament or exposure fingerprints using neural networks (U.S. Patent No. 12452985). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12452985

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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