The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Apr. 24, 2023
Fujitsu Limited, Kawasaki, JP;
Tong Ye, Beijing, CN;
Zhenning Tao, Beijing, CN;
Xiaofei Su, Beijing, CN;
Chengwu Yang, Beijing, CN;
Fujitsu Limited, Kawasaki, JP;
Abstract
A method, an apparatus and a system to measure nonlinear correlation parameters of a nonlinear device, a processor to, perform band-stop filtering on a signal to be measured to generate a notch signal, and calculate a first nonlinear correlation parameter of the nonlinear device when the signal to be measured is transmitted according to a first output signal of the nonlinear device after the notch signal is input into the nonlinear device; calculate gain compression correction coefficients according to a second output signal of the nonlinear device after the first input signal is input into the nonlinear. The first input signal and the signal to be measured may have identical power and different signal probability distribution. The processor is to correct the first nonlinear correlation parameter according to the gain compression correction coefficients to obtain a second nonlinear correlation parameter of the nonlinear device when the signal to be measured is transmitted.