The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Jan. 13, 2022
Applicant:

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventor:

Takashi Inoue, Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/2507 (2013.01); H04J 14/02 (2006.01);
U.S. Cl.
CPC ...
H04B 10/2507 (2013.01); H04J 14/02 (2013.01); H04J 14/0201 (2013.01);
Abstract

This method includes optimizing, by a gradient descent method, a first parameter used in back propagation processing and associated with XPM and a second parameter used in the back propagation processing and associated with SPM and XPM, wherein the back propagation processing is processing to estimate a waveform at a time of transmission by alternately calculating linear terms and nonlinear terms in a nonlinear Schrödinger equation after receiving an optical signal whose waveform shape changed in a transmission line and digitizing a waveform of the received optical signal, and correct, for each channel of plural channels in the transmission line at a time of wavelength-division multiplexing transmission, waveform distortion caused by SPM that occurs in the channel and waveform distortion caused by XPM that occurs in relation with channels other than the channel; and executing the back propagation processing by using the optimized first and second parameters.


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