The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Apr. 27, 2021
Applicant:
Agc Inc., Tokyo, JP;
Inventors:
Assignee:
AGC Inc., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
C03C 10/00 (2006.01); C03B 32/02 (2006.01); C03C 8/06 (2006.01); C03C 10/16 (2006.01); H01M 10/0525 (2010.01); H01M 10/0562 (2010.01); H01B 1/06 (2006.01);
U.S. Cl.
CPC ...
H01M 10/0562 (2013.01); C03B 32/02 (2013.01); C03C 8/06 (2013.01); C03C 10/0054 (2013.01); C03C 10/16 (2013.01); H01M 10/0525 (2013.01); C03C 2204/00 (2013.01); C03C 2205/00 (2013.01); H01B 1/06 (2013.01); H01M 2300/008 (2013.01); H01M 2300/0091 (2013.01);
Abstract
A glass frit includes a glass which contains: Li; at least one selected from the group consisting of B, Si, P, Ge, and Te; O; and at least one selected from the group consisting of F, Cl, Br, and I. The glass is to turn into a crystallized glass including an amorphous phase and a crystalline phase, the crystalline phase precipitated by a heat treatment at a temperature equal to or higher than a glass transition temperature and equal to or lower than a glass crystallization temperature. The crystallized glass shows diffraction peaks at 2θ=22.8±0.5°, 2θ=32.1±0.5° and 2θ=39.6±0.5° in a powder X-ray diffraction pattern using Cu-Kα radiation.