The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Jan. 30, 2023
Applicant:

Verint Americas Inc, Alpharetta, GA (US);

Inventors:

Michael Sutton, Petah Tikva, IL;

Zvi Figov, Modiin, IL;

Nir Naor, Ramat Hasharon, IL;

Assignee:

Verint Americas Inc., Alpharetta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06F 16/78 (2019.01); G06V 10/774 (2022.01); G06V 20/40 (2022.01);
U.S. Cl.
CPC ...
G06V 20/44 (2022.01); G06F 16/7867 (2019.01); G06V 10/774 (2022.01);
Abstract

A tagging system gathers all events (tagged and untagged) generated by remote sensors at a location or facility over time. Based on the gathered events the tagging system uses machine learning to train a model to learn the sensor layout of a facility or location and the timing between the triggering of sensors. Once trained, the model can predict the movement and location of individuals and objects throughout the facility based on a starting tagged event. Given a series of tagged and untagged events, the system can use the movement predictions of the model to tag the untagged events in the series with the identification of an individual or object that triggered the generation of the untagged event.


Find Patent Forward Citations

Loading…