The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Mar. 12, 2021
Applicant:

Information System Engineering Inc., Tokyo, JP;

Inventor:

Satoshi Kuroda, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/00 (2022.01); G06F 16/907 (2019.01); G06F 18/21 (2023.01); G06N 3/045 (2023.01); G06N 3/08 (2023.01); G06N 20/00 (2019.01); G06Q 10/0633 (2023.01); G06V 10/70 (2022.01);
U.S. Cl.
CPC ...
G06V 20/35 (2022.01); G06F 16/907 (2019.01); G06N 3/045 (2023.01); G06N 20/00 (2019.01); G06Q 10/0633 (2013.01); G06V 10/87 (2022.01); G06F 18/21 (2023.01); G06N 3/08 (2013.01); G06V 2201/10 (2022.01);
Abstract

An information processing device to output work information, which is information related to work performed by a user, has a scene estimation unit to acquire a first image, location information, and time information, all relating to the work, and to estimate a scene by using a first trained model, a chunk estimation unit to acquire a second image, of equipment related to the work, and estimate a chunk by using one of a plurality of second trained models, in which associations among the second image, a chunk ID that uniquely identifies the chunk, which is information that divides or suggests the work information, and one or a plurality of chunk-meta IDs that are associated on a one-to-one basis, are stored, and an output unit to output the chunk.


Find Patent Forward Citations

Kuroda, Satoshi. (2025). Information processing device and method for scene estimation and chunk estimation (U.S. Patent No. 12450900). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12450900

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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