The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

May. 04, 2021
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Evan Mclaughlin, Guelph, CA;

Farzin Aghdasi, East Palo Alto, CA (US);

Milind Naphade, Cupertino, CA (US);

Arihant Jain, Fremont, CA (US);

Sujit Biswas, San Jose, CA (US);

Parthasarathy Sriram, Los Altos Hills, CA (US);

Assignee:

Nvidia Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/10 (2022.01); G01C 21/34 (2006.01); G01C 21/36 (2006.01); G06V 20/20 (2022.01); G06V 20/54 (2022.01);
U.S. Cl.
CPC ...
G06V 20/182 (2022.01); G01C 21/3476 (2013.01); G01C 21/3614 (2013.01); G06V 20/20 (2022.01); G06V 20/54 (2022.01);
Abstract

Calibration of various sensors may be difficult without specialized software to process intrinsic and extrinsic information about the sensors. Certain types of input files, such as image files, may also lack certain information, like depth information, to effectively translate regions of interest between images taken from a different perspective. Landmarks can be used to establish points for associating regions of interest between images taken from a different perspective and provided as an overlay to verify sensor calibration.


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