The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Jan. 24, 2023
Walmart Apollo, Llc, Bentonville, AR (US);
Raghava Balusu, Achanta, IN;
Avinash M. Jade, Bangalore, IN;
Lingfeng Zhang, Dallas, TX (US);
William C. Robinson, Jr., Centerton, AR (US);
Benjamin R. Ellison, San Francisco, CA (US);
Srinivas Muktevi, Bengaluru, IN;
Amit Jhunjhunwala, Bangalore, IN;
Zhaoliang Duan, Frisco, TX (US);
Siddhartha Chakraborty, Kolkata, IN;
Ashlin Ghosh, Ernakulam, IN;
Mingquan Yuan, Flower Mound, TX (US);
Walmart Apollo, LLC, Bentonville, AR (US);
Abstract
In some embodiments, apparatuses and methods are provided herein useful to processing captured images of objects at a product storage facility. In some embodiments, there is provided a system for processing captured images of objects including a trained machine learning model and a control circuit. In some embodiments, the trained machine learning model is configured to process unprocessed captured images. In some embodiments, the control circuit is configured to associate each of the processed images into one of a first group, a second group, or a third group; remove at least one processed image associated with the first group from the processed images in accordance with a first processing rule; and output remaining processed images associated with the first group and processed images associated with the second group to be used to retrain the trained machine learning model.