The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Jul. 22, 2022
Applicant:

Canon Virginia, Inc., Newport News, VA (US);

Inventors:

Xiwu Cao, Arcadia, CA (US);

Bradley Scott Denney, Irvine, CA (US);

Assignee:

Canon Virginia, Inc., Newport News, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/50 (2022.01); G06F 18/2113 (2023.01); G06F 18/214 (2023.01); G06V 10/75 (2022.01); G06V 10/774 (2022.01);
U.S. Cl.
CPC ...
G06V 10/50 (2022.01); G06F 18/2113 (2023.01); G06F 18/214 (2023.01); G06V 10/751 (2022.01); G06V 10/774 (2022.01);
Abstract

Devices, systems, and methods obtain one or more training images; obtain a test image; select one or more associated pixels in the training images for a target pixel in the training images; calculate respective value relationships between a value of the target pixel and respective values of the associated pixels in the training images; select one or more associated pixels in the test image for a target pixel in the test image; and detect an anomaly in the target pixel in the test image based on the respective value relationships between the value of the target pixel and the respective values of the associated pixels in the training images and on respective value relationships between a value of the target pixel and respective values of the associated pixels in the test image.


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