The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Mar. 15, 2021
Basf SE, Ludwigshafen am Rhein, DE;
Aranzazu Bereciartua-Perez, Derio, ES;
Artzai Picon Ruiz, Derio, ES;
Corinna Maria Spangler, Ludwigshafen, DE;
Christian Klukas, Limburgerhof, DE;
Till Eggers, Ludwigshafen, DE;
Jone Echazarra Huguet, Derio, ES;
Ramon Navarra-Mestre, Limburgerhof, DE;
BASF SE, Ludwigshafen am Rhein, DE;
Abstract
To quantify biotic damage in leaves of crop plants, a computer receives (A) a leaf-image taken from a particular crop plant. The leaf-image shows at least one of the leaves of the particular crop plant. Using a first convolutional neural network (CNN,), the computer processes the leaf-image to derive a segmented leaf-image () being a contiguous set of pixels that show a main leaf of the particular plant completely. The first CNN has been trained by a plurality of leaf-annotated leaf-images (A), wherein the leaf-images are annotated to identify main leaves (). Using a second CNN (), the computer processes the single-leaf-image by regression to obtain a damage degree ().