The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Feb. 20, 2025
Applicant:

Chung Ang University Industry Academic Cooperation Foundation, Seoul, KR;

Inventors:

Jong Won Choi, Gyeongsangnam-do, KR;

Min Gyu Lee, Seoul, KR;

Do Hee Kim, Seoul, KR;

Yu Jeong Oh, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G06F 17/10 (2006.01); G06F 40/40 (2020.01); G06N 3/08 (2023.01); G06T 9/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/001 (2013.01); G06F 40/40 (2020.01); G06T 9/00 (2013.01);
Abstract

A method for generating deformed images includes receiving an original image including a non-defective object and augmenting the original image into a plurality of images, receiving the plurality of augmented original images and generating a deformed image from each of the augmented original images, receiving a name of an object included in the original image as text and generating an optimal prompt based on the name of the object, and determining whether to store the deformed image in a non-defective data pool based on the optimal prompt and the plurality of generated deformed images.


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