The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Nov. 28, 2022
Applicant:
Naver Labs Corporation, Seongnam-si, KR;
Inventor:
Junho Jeon, Seongnam-si, KR;
Assignee:
NAVER CORPORATION, Seongnam-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/77 (2022.01); G01S 17/894 (2020.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G01S 17/894 (2020.01); G06V 10/7715 (2022.01); G06T 2200/04 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30252 (2013.01);
Abstract
A method for generating a visual feature map includes receiving a first image, detecting a first set of keypoints from the first image, extracting a visual feature descriptor of each of the first set of keypoints, receiving a first set of 3D point cloud data associated with a location where the first image is captured, and determining a 3D coordinate value of each of the first set of keypoints using the first set of 3D point cloud data.