The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Aug. 05, 2022
Applicant:

Siemens Energy Global Gmbh & Co. KG, Bayern, DE;

Inventors:

Leonid Kostrykin, Heidelberg, DE;

Claus Rohr, Schwetzingen, DE;

Karl Rohr, Hambrücken, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06T 7/30 (2017.01); H04N 23/695 (2023.01);
U.S. Cl.
CPC ...
G06T 7/30 (2017.01); H04N 7/18 (2013.01); H04N 23/695 (2023.01); G06T 2207/10016 (2013.01);
Abstract

A method for monitoring the state of a component, includes: creating a video showing a region of the component and assembling a specified number n of captured frames of the video by (a) parameterising the individual transformations by one vector per frame, which vector defines the relevant Euclidean transformation, and forming a matrix P which includes the individual transformation parameters in the sequence of the frames; (b) constructing a graph which represents a specified energy function E which is dependent on the intensity data G which include the intensities of the individual images, and on the matrix P of the transformation parameters; (c) minimising the specified energy function by the constructed graph, in order to determine the optimal matrix P of the transformation parameters; and (d) orienting the frames in a global coordinate system by Euclidean transformations and the previously determined optimal matrix P of the transformation parameters.


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Kostrykin, Leonid. (2025). Method and device for monitoring the state of a component (U.S. Patent No. 12450758). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12450758

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