The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
May. 03, 2021
Koninklijke Philips N.v., Eindhoven, NL;
Vidya Madapusi Srinivas Prasad, Bangalore, IN;
Srinivasa Rao Kundeti, Movva, IN;
Manikanda Krishnan V, Bangalore, IN;
Vijayananda Jagannatha, Bangalore, IN;
KONINKLIJKE PHLIPS N.V., Eindhoven, NL;
Abstract
Disclosed herein is a method and system for identifying abnormal images in a set of medical images for optimal assessment of the medical images. A plurality of global features from each medical image is extracted based on pretrained weights associated with each global feature. Similarly, plurality of local features from each medical image is extracted analyzing a predefined number of image patches generated from a higher resolution image corresponding to each medical image. Further, an abnormality score for each medical image is determined based on weights associated with a combined feature set obtained by concatenating the plurality of global features and the plurality of local features. Thereafter, the medical image is identified as an abnormal image when the abnormality score of the medical image is higher than a predefined first threshold score.