The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2025
Filed:
Jun. 07, 2023
Fanuc Corporation, Yamanashi, JP;
Yujiao Cheng, Fremont, CA (US);
Tetsuaki Kato, Fremont, CA (US);
FANUC CORPORATION, Yamanashi, JP;
Abstract
A method for anomaly detection from object images. A feature extractor provides feature data characterizing part images, including good parts and bad parts. Training data for good parts is used to create a k-nearest neighbors (k-NN) model core set. Adaptation data for some good and some bad parts is evaluated by a k-NN module to determine an anomaly score from the feature data. A good-vs-bad threshold for the anomaly score is initially set to a low value. When an anomaly score over the threshold is detected, a human inspects the corresponding image to determine whether the subject part is good or bad. If the part is good and the anomaly was false, the k-NN model core set is updated to include the feature data for the subject part, and the threshold is adjusted higher. After every adaptation, the k-NN model is applied to a test data set to evaluate performance.